ZEISS SIGMA VP Field Emission Scanning Electron Microscope
(Carl Zeiss Microscopy GmbH, Germany)
With its variable pressure modes of operation, ZEISS SIGMA VP field emission scanning electron microscope (FE-SEM) allows imaging of non-conducting samples. The system offers many advantages for applications in environmental analysis and (in combination with cryo equipment, see below) enables true surface imaging of nanoparticles, bacteria, cells, etc.
Our FE-SEM system is equiped with EDS Quantax XFlash 6l60 Detector (Bruker Nano GmbH, Germany) which is suitable for analysis of nanoparticles and (micro)biological samples.
Financial support by the German Research Foundation (DFG, "Forschungsgroßgeräte") is gratefully acknowledged.